Share Email Print
cover

Proceedings Paper

Systematic and accurate characterization of infrared detectors for strategic surveillance applications
Author(s): Raymond K. Purvis; James R. Duffey
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Intelligent decisions on the selection of infrared Focal Plane Arrays for sensor systems can only be made if testing of the individual detectors/arrays is carried out in a systematic and accurate manner. Devices are often tested several months apart, in different locations and under varying radiation conditions. This paper discusses various experimental methods that can be used to insure that consistent, accurate results are obtained. Radiometric parameters must be carefully controlled. Blackbodies make excellent reproducible infrared sources when used correctly, as they can be calibrated with simple thermocouples. Selection of blackbody temperature for various wavelengths of interest is important since measurements in a poorly chosen spectral region can translate minor blackbody temperature fluctuations into large errors in detector photon flux. Design of Dewar geometry is extremely important for low background measurements, as large errors can occur due to unwanted reflections or light leaks. The physical dimension of any limiting apertures must be measured precisely. Filter characterization must be accomplished for each filter or window used at the temperature of interest. With care, systematic and accurate measurements, and hence valid comparisons, can be made between detectors measured at different sites and times.

Paper Details

Date Published: 30 May 1995
PDF: 12 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210557
Show Author Affiliations
Raymond K. Purvis, Air Force Phillips Lab. (United States)
James R. Duffey, Maxwell Labs. (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

© SPIE. Terms of Use
Back to Top