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Proceedings Paper

Test and evaluation facility for THAAD IR seekers
Author(s): Arthur R. Leary; Walter Watson; D. Florie; J. Colosimo; John A. Hoschette; G. Murphy
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Paper Abstract

The high performance requirements for the Theater High Altitude Area Defense (THAAD) Seeker required the build and verification of a state-of-the-art infrared seeker test and evaluation facility. The test and evaluation facility is completely enclosed in a class 10,000 clean room and is divided into four major areas. These areas are the build and assembly area, goniometric test area, boresight test area, and analysis area. The build and assembly area is where parts are inspected, cleaned, kitted and finally assembled. After assembly is complete, the seeker is moved to the goniometric and boresight test areas for calibration and test. The goniometric/radiometric test area is where seeker gain and offset, IFOV, FOV, FOR, PSF's, dynamic range and uniformity tests are performed. The boresight test area is where the seeker boresight and servo rate tests are conducted. The seeker operation and performance is controlled and monitored via the Seeker Test Set (STS). The STS provides seeker power, controls all seeker functions, collects simultaneous servo and image data and controls table movements and blackbody target temperatures. For storage and further analysis of data, the STS has been networked via an ethernet connection to the data analysis area. The analysis area contains an off-line data processing and reduction lab consisting of networked high performance PC's. This paper discusses the test facility created for the THAAD IR seeker including requirements, layout and unique functionality.

Paper Details

Date Published: 30 May 1995
PDF: 6 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210551
Show Author Affiliations
Arthur R. Leary, Loral Infrared & Imaging Systems, Inc. (United States)
Walter Watson, Loral Infrared & Imaging Systems, Inc. (United States)
D. Florie, Loral Infrared & Imaging Systems, Inc. (United States)
J. Colosimo, Loral Infrared & Imaging Systems, Inc. (United States)
John A. Hoschette, Loral Infrared & Imaging Systems, Inc. (United States)
G. Murphy, Loral Infrared & Imaging Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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