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Proceedings Paper

Integrated approach to focal plane array testing at the Arnold Engineering Development Center
Author(s): Randy A. Nicholson; Kimberly D. Mead
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Paper Abstract

The Arnold Engineering Development Center (AEDC) has developed an extensive focal plane array (FPA) test capability that can be used to measure performance at the detector array or hybrid array level. The test capability has been developed around an integrated approach to sensor testing. A suite of test facilities has been developed to allow both radiometric calibration to be performed and mission simulation issues to be evaluated. The test facilities can be interfaced either to the FPA or to the array with its accompanying signal processing electronics. More than 100 FPAs of various sizes and types have been characterized to varying degrees in the AEDC FPA test facilities. Arrays designed for both strategic and tactical applications have been characterized. Numerous reports and data packages have been produced to document these tests. Extensive analysis of data acquired has been performed for a large number of arrays.

Paper Details

Date Published: 30 May 1995
PDF: 9 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210550
Show Author Affiliations
Randy A. Nicholson, Micro Craft Technology (United States)
Kimberly D. Mead, Micro Craft Technology (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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