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Proceedings Paper

Direct-write scene generation test facility system noise study
Author(s): D. Michael Tripp; Heard S. Lowry; Parker David Elrod
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Paper Abstract

The Scene Generation Test Capability (SGTC) program at AEDC has completed development of the Direct Write Scene Generation (DWSG) test facilities which provide a dynamic mission simulation capability for Focal Plane Arrays (FPAs) and their associated signal processing electronics. The first phase of the program was completed in September 1991 and supplied a near-term test capability (designated for Transportable Direct Write Scene Generator, or TDWSG) to meet the test requirements of future early warning sensor systems. Over the last two years the TDWSG has been involved in test activities to validate the DWSG technique for meeting system mission simulation requirements. The DWSG approach is based on the ability to accurately control the position and amplitude of multiple laser beams through the application of radio frequencies to a set of acousto-optic deflectors. One of the primary concerns related to using the TDWSG for mission simulation is the system noise associated with the test facility. A system noise study was conducted using a low noise LWIR Si:As FPA and an optical power meter. Radiometric signal and noise measurements were acquired and used as a baseline for comparison with the TDWSG data to quantify the noise contributions of individual TDWSG subsystems. This paper presents an overview of the DWSG concept, results of the system noise study, and results of system precision measurements.

Paper Details

Date Published: 30 May 1995
PDF: 12 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210548
Show Author Affiliations
D. Michael Tripp, Micro Craft Technology (United States)
Heard S. Lowry, Micro Craft Technology (United States)
Parker David Elrod, Micro Craft Technology (United States)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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