Share Email Print
cover

Proceedings Paper

CMOS analog-to-digital conversion for uncooled bolometer infrared detector arrays
Author(s): Ulf Ringh; Christer Jansson; Kevin Charles Liddiard
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Bias and signal conditioning techniques for uncooled resistance bolometer infrared detectors employ dc bias or various ac modulation and readout techniques. This paper describes a novel method of converting the absorbed incident radiation into digital signals by use of 0.8 micrometers CMOS oscillators in each pixel. Incoming radiation causes a resistance change in the bolometer which in turn results in a frequency shift. A concept of accurately readout out the digital signals from each pixel in the array is presented. Pixelwise A/D conversion and readout is demonstrated using a thin film semiconductor bolometer detector array. An NETD (Noise Equivalent Temperature Difference) of 0.1 K has been measured.

Paper Details

Date Published: 30 May 1995
PDF: 10 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210544
Show Author Affiliations
Ulf Ringh, National Defence Research Establishment (Sweden)
Christer Jansson, Linkoping Univ. (Sweden)
Kevin Charles Liddiard, DSTO (Australia)


Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

© SPIE. Terms of Use
Back to Top