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Proceedings Paper

CMOS analog-to-digital conversion for uncooled bolometer infrared detector arrays
Author(s): Ulf Ringh; Christer Jansson; Kevin Charles Liddiard
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Paper Abstract

Bias and signal conditioning techniques for uncooled resistance bolometer infrared detectors employ dc bias or various ac modulation and readout techniques. This paper describes a novel method of converting the absorbed incident radiation into digital signals by use of 0.8 micrometers CMOS oscillators in each pixel. Incoming radiation causes a resistance change in the bolometer which in turn results in a frequency shift. A concept of accurately readout out the digital signals from each pixel in the array is presented. Pixelwise A/D conversion and readout is demonstrated using a thin film semiconductor bolometer detector array. An NETD (Noise Equivalent Temperature Difference) of 0.1 K has been measured.

Paper Details

Date Published: 30 May 1995
PDF: 10 pages
Proc. SPIE 2474, Smart Focal Plane Arrays and Focal Plane Array Testing, (30 May 1995); doi: 10.1117/12.210544
Show Author Affiliations
Ulf Ringh, National Defence Research Establishment (Sweden)
Christer Jansson, Linkoping Univ. (Sweden)
Kevin Charles Liddiard, DSTO (Australia)

Published in SPIE Proceedings Vol. 2474:
Smart Focal Plane Arrays and Focal Plane Array Testing
Marc Wigdor; Mark A. Massie, Editor(s)

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