Share Email Print
cover

Proceedings Paper

Detection and ranging of material flaws using microwave transmission-line reflectometry
Author(s): William W. Milroy; Ronald I. Wolfson
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Two methods for monitoring structural integrity with microwave transmission-line reflectometry are described. The first approach uses a meandering RF transmission line, while the second consists of a bounded dielectric region such as a parallel-plate waveguide. Either of these devices can be embedded in or adhered to a composite or metal panel of the structure. A microwave signal is introduced on the transmission line and produces a reflection at any discontinuity as the wave propagates. This creates a signature reflection wave whose salient features can be stored for future reference. If the substrate subsequently becomes flawed, an extraneous reflection is created in the vicinity of the flaw. By comparing this reflection with the signature, the presence and location of both new and progressive laws can be determined. Experimental verification of the second technique for the detection of flaws is presented.

Paper Details

Date Published: 26 May 1995
PDF: 4 pages
Proc. SPIE 2448, Smart Structures and Materials 1995: Smart Electronics, (26 May 1995); doi: 10.1117/12.210464
Show Author Affiliations
William W. Milroy, Hughes Aerospace and Electronics Co. (United States)
Ronald I. Wolfson, Hughes Aerospace and Electronics Co. (United States)


Published in SPIE Proceedings Vol. 2448:
Smart Structures and Materials 1995: Smart Electronics
Vijay K. Varadan, Editor(s)

© SPIE. Terms of Use
Back to Top