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Proceedings Paper

High field-of-view IR scanner using microlens arrays
Author(s): Chen Feng; Anees Ahmad; RamaGopal V. Sarepaka
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Paper Abstract

There is a growing demand for a larger field coverage for scanning in IR instrumentation. We have explored the possibility of using the microlens arrays (MLAs) for this purpose, and have developed a generic IR imaging scanner. The application of MLAs in the wide-field IR imagers is presented, along with their advantages and limitations. A series of systems using MLAs and diffractive elements have been designed and analyzed for a diffraction-limited performance with 45 degree(s) and 60 degree(s) field of view for a f/1.4 IR imager operating in 3 - 5 micrometers wavelength range for 1-D and 2-D scanning applications. The optical design considerations, fabrication issues, and thermal effects are also discussed for these types of scanners.

Paper Details

Date Published: 22 May 1995
PDF: 12 pages
Proc. SPIE 2470, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI, (22 May 1995); doi: 10.1117/12.210053
Show Author Affiliations
Chen Feng, Univ. of Alabama in Huntsville (United States)
Anees Ahmad, Univ. of Alabama in Huntsville (United States)
RamaGopal V. Sarepaka, Univ. of Alabama in Huntsville (United States)


Published in SPIE Proceedings Vol. 2470:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing VI
Gerald C. Holst, Editor(s)

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