Share Email Print
cover

Proceedings Paper

Flaw detection in d33-mode ceramic multilayer actuators using impedance-frequency scans
Author(s): Manfred Kahn; Daniel J. Krause; Mark T. Chase
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A method to detect linear flaws in piezoelectric actuators is demonstrated. Piezoelectrically induced vibrations are excited in the actuator at a large number of closely spaced frequencies. At frequencies of mechanical resonance there are steep impedance peaks and a peak pattern is generated that is characteristic of a particular actuator configuration. It is shown that when the amplitudes of such peaks are abnormally low, i.e. 50% or less, or when there are peaks > 2kHz removed from 'normal' peak locations, significant internal flaws are present.

Paper Details

Date Published: 12 May 1995
PDF: 9 pages
Proc. SPIE 2447, Smart Structures and Materials 1995: Industrial and Commercial Applications of Smart Structures Technologies, (12 May 1995); doi: 10.1117/12.209346
Show Author Affiliations
Manfred Kahn, Naval Research Lab. (United States)
Daniel J. Krause, Naval Research Lab. (United States)
Mark T. Chase, Potomac Research International (United States)


Published in SPIE Proceedings Vol. 2447:
Smart Structures and Materials 1995: Industrial and Commercial Applications of Smart Structures Technologies
C. Robert Crowe; Gary L. Anderson, Editor(s)

© SPIE. Terms of Use
Back to Top