Share Email Print

Proceedings Paper

Cryogenic noise performance of OMVPE-grown InGaAs/InP MODFET
Author(s): Jinbo Kuang; Young-Kai Chen; M. A. Chin; Ralph A. Logan; Tawee Tanbun-Ek; Lester Fuess Eastman
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Details

Date Published: 1 August 1990
PDF: 11 pages
Proc. SPIE 1288, High-Speed Electronics and Device Scaling, (1 August 1990); doi: 10.1117/12.20926
Show Author Affiliations
Jinbo Kuang, Cornell Univ. (United States)
Young-Kai Chen, AT&T Bell Labs. (United States)
M. A. Chin, AT&T Bell Labs. (United States)
Ralph A. Logan, AT&T Bell Labs. (United States)
Tawee Tanbun-Ek, AT&T Bell Labs. (United States)
Lester Fuess Eastman, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 1288:
High-Speed Electronics and Device Scaling
Lester Fuess Eastman, Editor(s)

© SPIE. Terms of Use
Back to Top