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Proceedings Paper

Simultaneous determination of thickness and optical constants of thin films
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Paper Abstract

A new technique that furnishes simultaneous and unambiguous determination of thickness and n(A) and k(A) spectra as well as energy bandgap, Eg , of a wide variety of semiconductor and dielectric thin films deposited on either opaque or transparent substrates will be described. The n(A) and k(A) spectra are determined over a wide range of wavelengths from deep-ultraviolet to near-infrared (190 nm ) 900 nm). Films as thin as 20 A can be measured. The technique is based on reflection/absorption spectroscopy and optical dispersion equations derived by A.R. Forouhi and I. Bloomer. Applications include, but are not limited to: a-C:H on magnetic disks and on A1TiC (with or without a thin SiNX adhesion layer), SiN:H and SiO:H deposited on Si, a-Si:H deposited on oxidized Si, ITO deposited on glass or quartz, SiO on glass, and TiO on quartz. Furthermore, the technique can be used to characterize the damaged silicon surface layer produced by plasma cleaning of bare crystalline silicon wafers.

Paper Details

Date Published: 22 May 1995
PDF: 11 pages
Proc. SPIE 2439, Integrated Circuit Metrology, Inspection, and Process Control IX, (22 May 1995); doi: 10.1117/12.209240
Show Author Affiliations
A. Rahim Forouhi, n & k Technology, Inc. (United States)
Iris Bloomer, n & k Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 2439:
Integrated Circuit Metrology, Inspection, and Process Control IX
Marylyn Hoy Bennett, Editor(s)

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