Share Email Print

Proceedings Paper

Performance of the prototype NIST SRM 2090A SEM magnification standard in a low-accelerating-voltage SEM
Author(s): Brian L. Newell; Michael T. Postek; Jan P. van der Ziel
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A new NIST SEM magnification calibration standard has been fabricated and characterized in production prototype form. The SRM 2090A samples contain structures ranging in pitch from 3000 micrometers to 0.2 micrometers and are useful at both high and low accelerating voltages. The design and fabrication of the samples has incorporated many of the improvements suggested through two previous prototype series. Since the low- accelerating voltage, critical-dimension measurement scanning electron microscope has assumed an important role in modern semiconductor process control. We investigate the use and performance of the samples in a representative instrument. Scan area contamination from a prolonged high magnification scan is shown to be a significant issue. A cleaning procedure developed for a previous prototype series has been modified to obtain acceptable results on the present samples.

Paper Details

Date Published: 22 May 1995
PDF: 8 pages
Proc. SPIE 2439, Integrated Circuit Metrology, Inspection, and Process Control IX, (22 May 1995); doi: 10.1117/12.209237
Show Author Affiliations
Brian L. Newell, Texas Instruments Inc. (United States)
Michael T. Postek, National Institute of Standards and Technology (United States)
Jan P. van der Ziel, Univ. of Texas/Dallas (United States)

Published in SPIE Proceedings Vol. 2439:
Integrated Circuit Metrology, Inspection, and Process Control IX
Marylyn Hoy Bennett, Editor(s)

© SPIE. Terms of Use
Back to Top