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Proceedings Paper

Photosclerosis of cutaneous vascular malformations with a pulsed 810-nm diode laser
Author(s): Lawrence S. Bass
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Paper Abstract

Various continuous wave lasers have been effectively used for sclerosis of cutaneous vascular lesions. The risk of scarring has been as high as 15% in some applications, however. Pulse dye lasers have virtually eliminated scarring as a complication, substituting high cost and cumbersome operation. Pre-clinical studies have demonstrated the ability of the 810 nm gallium-aluminum-arsenide diode laser in photosclerosis. In this study, a small group of patients (n equals 6) were treated with a pulsed 810 nm diode laser (Surgimedics, The Woodlands, TX). Pulse widths used were 5 - 15 msec with corresponding energy densities during the square wave pulse of 14 - 42 J/cm2. Pulse interval was 32 msec. Lesions treated include telangiectasias (n equals 5), spider veins, (n equals 4), capillary dermal malformation (n equals 1) and a cutaneous venous malformation (n equals 1). Lower extremity spider veins were the most resistent to treatment, rarely disappearing entirely. Telangiectasias were most responsive, usually disappearing after one treatment. No scarring was noted and textural changes were seen in only one patient. While these data are preliminary and parameters have not been optimized, pulsed diode laser exposure can be an effective treatment for cutaneous vascular lesions.

Paper Details

Date Published: 12 May 1995
PDF: 7 pages
Proc. SPIE 2395, Lasers in Surgery: Advanced Characterization, Therapeutics, and Systems V, (12 May 1995); doi: 10.1117/12.209143
Show Author Affiliations
Lawrence S. Bass, Columbia Univ. College of Physicians and Surgeons (United States)


Published in SPIE Proceedings Vol. 2395:
Lasers in Surgery: Advanced Characterization, Therapeutics, and Systems V
R. Rox Anderson; Graham M. Watson; Rudolf W. Steiner; Douglas E. Johnson; Stanley M. Shapshay; Michail M. Pankratov; George S. Abela; Lawrence S. Bass; John V. White; Rodney A. White; Kenneth Eugene Bartels; Lloyd P. Tate; C. Thomas Vangsness, Editor(s)

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