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Proceedings Paper

Simulation and detection of electron back-scattering in ion barrier films of micro-channel plate
Author(s): Shencheng Fu; Ye Li; Feng Shi; Zhuang Miao; Hongchang Cheng; Qingduo Duanmu
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Paper Abstract

The simulation calculation and analysis on the electron backscattering for ion barrier films (IBFs) of Al2O3 were performed by Monte Carlo methods. Simulation and experimental detection both found that electron backscattering ratio is inversely proportional to the incident electron energy, proportional to the film thickness and density. But if the film is thick enough, the back scattering ratio will not continue to increase, will maintain a relatively stable value. This work provided a theory support for fabricating high performance low-level-light device.

Paper Details

Date Published: 4 March 2015
PDF: 5 pages
Proc. SPIE 9521, Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I, 952109 (4 March 2015); doi: 10.1117/12.2087256
Show Author Affiliations
Shencheng Fu, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Changchun Univ. of Science and Technology (China)
Ye Li, Changchun Univ. of Science and Technology (China)
Feng Shi, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Zhuang Miao, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Hongchang Cheng, Science and Technology on Low-Light-Level Night Vision Lab. (China)
Qingduo Duanmu, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 9521:
Selected Papers from Conferences of the Photoelectronic Technology Committee of the Chinese Society of Astronautics 2014, Part I
Xun Hou; Zhihong Wang; Lingan Wu; Jing Ma, Editor(s)

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