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Proceedings Paper

A new approach on JPSS VIIRS BCS and SVS PRT calibration
Author(s): Tung R. Wang; Steve Marschke; Michael Borroto; Christopher M. Jones; Christopher Chovit
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Paper Abstract

A set of calibrated platinum resistance thermometers (PRT’s) was used to monitor the temperature of a Blackbody Calibration Source (BCS) and Space View Source (SVS). BCS is Ground Support Equipment (GSE) used to validate the emissive band calibration of Visible Infrared Imaging Radiometer Suite (VIIRS) of the Joint Polar Satellite System (JPSS). Another GSE, the SVS was used as an optical simulator to provide zero radiance sources for all VIIRS bands. The required PRT temperature 1 uncertainty is less than 0.030K. A process was developed to calibrate the PRTs in its thermal block by selecting a single thermal bath fluid that is compatible with spaceflight, is easy to clean and supported the entire temperature range. The process involves thermal cycling the PRTs that are installed in an aluminum housing using RTV566A prior to calibration. The PRTs were calibrated thermal cycled again and then calibrated once more to verify repeatability. Once completed these PRTs were installed on both the BCS and SVS. The PRT calibration uncertainty was estimated and deemed sufficient to support the effective temperature requirements for the operating temperature range of the BCS and SVS.

Paper Details

Date Published: 12 May 2015
PDF: 12 pages
Proc. SPIE 9485, Thermosense: Thermal Infrared Applications XXXVII, 948505 (12 May 2015); doi: 10.1117/12.2086928
Show Author Affiliations
Tung R. Wang, Raytheon Space and Airborne Systems (United States)
Steve Marschke, Raytheon Space and Airborne Systems (United States)
Michael Borroto, Raytheon Space and Airborne Systems (United States)
Christopher M. Jones, Raytheon Space and Airborne Systems (United States)
Christopher Chovit, Raytheon Space and Airborne Systems (United States)


Published in SPIE Proceedings Vol. 9485:
Thermosense: Thermal Infrared Applications XXXVII
Sheng-Jen (Tony) Hsieh; Joseph N. Zalameda, Editor(s)

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