Share Email Print
cover

Proceedings Paper

Comparing the experimental resist image with aerial image intensity in high-NA projection lense
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In optical lithography, high-performance exposure tools are necessary to obtain not only fine patterns but also preciseness of the pattern width. Therefore, an accurate theoretical method is necessary to predict these values in practice. Conversely speaking, lithography experiments enables us to evaluate the validity of imaging theory. Thus some pioneer and valuable studies have been argued [1,2,3,4,5,6,7,8,9]. However there might be some ambiguity or no consensus for the treatment of diffraction by object in scalar imaging theory and a paradoxical phenomenon for the inclined entrance plane wave especially in vector imaging theory. Therefore we reconsider the imaging theory and compare the theoretical aerial image intensity with experimental pattern width.

Paper Details

Date Published: 18 March 2015
PDF: 12 pages
Proc. SPIE 9426, Optical Microlithography XXVIII, 94261C (18 March 2015); doi: 10.1117/12.2085454
Show Author Affiliations
Masato Shibuya, Tokyo Polytechnic Univ. (Japan)
Akira Takada, Topcon Corp. (Japan)
Toshiharu Nakashima, Nikon Corp. (Japan)


Published in SPIE Proceedings Vol. 9426:
Optical Microlithography XXVIII
Kafai Lai; Andreas Erdmann, Editor(s)

© SPIE. Terms of Use
Back to Top