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Proceedings Paper

Terahertz reflection interferometry for automobile paint layer thickness measurement
Author(s): Aunik Rahman; Kenneth Tator; Anis Rahman
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Paper Abstract

Non-destructive terahertz reflection interferometry offers many advantages for sub-surface inspection such as interrogation of hidden defects and measurement of layers’ thicknesses. Here, we describe a terahertz reflection interferometry (TRI) technique for non-contact measurement of paint panels where the paint is comprised of different layers of primer, basecoat, topcoat and clearcoat. Terahertz interferograms were generated by reflection from different layers of paints on a metallic substrate. These interferograms’ peak spacing arising from the delay-time response of respective layers, allow one to model the thicknesses of the constituent layers. Interferograms generated at different incident angles show that the interferograms are more pronounced at certain angles than others. This “optimum” angle is also a function of different paint and substrate combinations. An automated angular scanning algorithm helps visualizing the evolution of the interferograms as a function of incident angle and also enables the identification of optimum reflection angle for a given paint-substrate combination. Additionally, scanning at different points on a substrate reveals that there are observable variations from one point to another of the same sample over its entire surface area. This ability may be used as a quality control tool for in-situ inspection in a production line. Keywords: Terahertz reflective interferometry, Paint and coating layers, Non-destructive

Paper Details

Date Published: 14 May 2015
PDF: 6 pages
Proc. SPIE 9489, Dimensional Optical Metrology and Inspection for Practical Applications IV, 94890H (14 May 2015); doi: 10.1117/12.2085418
Show Author Affiliations
Aunik Rahman, Applied Research & Photonics, Inc. (United States)
Kenneth Tator, KTA-Tator, Inc. (United States)
Anis Rahman, Applied Research & Photonics, Inc. (United States)


Published in SPIE Proceedings Vol. 9489:
Dimensional Optical Metrology and Inspection for Practical Applications IV
Kevin G. Harding; Toru Yoshizawa, Editor(s)

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