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Proceedings Paper

Differential reflection spectroscopy: a versatile modulation technique for the study of the electronic properties of alloys, semiconductors, and thin films
Author(s): Rolf E. Hummel
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Paper Abstract

Differential Reflection Spectrometry utilizes two almost identical samples which are mounted stationary, side by side. The samples differe slightly in their surface properties, for example, in composition, crystal structure, etc. Unpolarized light is alternately deflected to one or the other specimen by means of a vibrating mirror. Electronic processing yields the difference in the reflectivities, that is, a first derivative-like spectrum. Examples for applications are given, such as in situ studies of corrosion and passivation in aqueous solutions, investigations of alloys, and studies of the fmer details of implantation damage in semiconducting materials.

Paper Details

Date Published: 1 August 1990
PDF: 8 pages
Proc. SPIE 1286, Modulation Spectroscopy, (1 August 1990); doi: 10.1117/12.20846
Show Author Affiliations
Rolf E. Hummel, Univ. of Florida (United States)

Published in SPIE Proceedings Vol. 1286:
Modulation Spectroscopy
Fred H. Pollak; Manuel Cardona; David E. Aspnes, Editor(s)

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