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Proceedings Paper

Application of harmonic analysis method based on two-dimensional Fourier transform to flatness error sampling
Author(s): Yu Wang; Xingwang Li; Dongdong Ma; Fugui Huang
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Paper Abstract

The flatness errors of several different parts were sampled from a Coordinate Measuring Machine and then the harmonic characteristics of flatness errors were analyzed by observing the three-dimensional frequency spectrum obtained by calculating the data through Two-Dimensional Fast Fourier Transform. It was found through experiment and analysis that each harmonic component of a flatness error is generally similar if the processing system is reliable, i.e. the highest harmonic wavelength of a random error is infinite, and Nyquist Sampling Theorem can not be applied to directly verify flatness error sampling points.

Paper Details

Date Published: 6 March 2015
PDF: 6 pages
Proc. SPIE 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation, 94460A (6 March 2015); doi: 10.1117/12.2084029
Show Author Affiliations
Yu Wang, Huaqiao Univ. (China)
Xingwang Li, Huaqiao Univ. (China)
Dongdong Ma, Huaqiao Univ. (China)
Fugui Huang, Huaqiao Univ. (China)

Published in SPIE Proceedings Vol. 9446:
Ninth International Symposium on Precision Engineering Measurement and Instrumentation
Junning Cui; Jiubin Tan; Xianfang Wen, Editor(s)

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