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Proceedings Paper

Effect of ink spreading and ink amount on the accuracy of the Yule-Nielsen modified spectral Neugebauer model
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Paper Abstract

To control printers so that the mixture of inks results in specific color under defined visual environment requires a spectral reflectance model that estimates reflectance spectra from nominal dot coverage. The topic of this paper is to investigate the dependence of the Yule-Nielsen modified spectral Neugebauer (YNSN) model accuracy on ink amount. It is shown that the performance of the YNSN model strongly depends on the maximum ink amount applied. In a cellular implementation, this limitation mainly occurs for high coverage prints, which impacts on the optimal cell design. Effective coverages derived from both Murray-Davis (MD) and YNSN show large ink spreading. As ink-jet printing is a non-impact printing process, the ink volume deposited per unit area (pixel) is constant, leading to the hypothesis that isolated ink dots have lower thickness that the full-tone ink film. Measured spectral reflectance curves show similar trend, which supports the hypothesis. The reduced accuracy of YNSN can thus be explained with the fact that patches with lower effective coverage have a mean ink thickness very different from that of the full-tone patch. The effect will be stronger for small dot coverage and large dot gain and could partially explain why the Yule-Nielsen n-factor is different for different inks. The performance of the YNSN model could be improved with integration of ink thickness variation.

Paper Details

Date Published: 8 February 2015
PDF: 6 pages
Proc. SPIE 9395, Color Imaging XX: Displaying, Processing, Hardcopy, and Applications, 93950E (8 February 2015); doi: 10.1117/12.2083366
Show Author Affiliations
Radovan Slavuj, Gjøvik Univ. College (Norway)
Ludovic G. Coppel, Gjøvik Univ. College (Norway)
Jon Yngve Hardeberg, Gjøvik Univ. College (Norway)

Published in SPIE Proceedings Vol. 9395:
Color Imaging XX: Displaying, Processing, Hardcopy, and Applications
Reiner Eschbach; Gabriel G. Marcu; Alessandro Rizzi, Editor(s)

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