Share Email Print
cover

Proceedings Paper

Modulation spectroscopy of semiconductor materials, interfaces, and microstructures: an overview
Author(s): Orest J. Glembocki
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Modulation techniques such as electroreflectance, photoreflectance and piezomodulation have become popular room temperature probes of the optical and electronic properties of two dimensional systems such as quantum wells and superlattices. Because of their derivative nature, they allow us to obtain sharp optical features related to interband transitions in the material under study. From this one can obtam transition energies of the microstructure of interest, from which quantum well widths, barrier heights and thicknesses (superlattice case) can be determined. As a direct consequence of the derivative nature of modulation spectroscopy (MS), information can be obtained about the response of the sample to the applied perturbation (used for the modulation), i.e. the electric field or optically induced free carriers. In this paper, we will review the application of MS to the study of optical and electronic properties of microstructures. We will consider not only the experimental implementation of the various techniques, but also discuss the nature of the electromodulation line shapes. From this it will be seen how these techniques can be applied to device structures. Examples from recent work will be presented.

Paper Details

Date Published: 1 August 1990
PDF: 29 pages
Proc. SPIE 1286, Modulation Spectroscopy, (1 August 1990); doi: 10.1117/12.20833
Show Author Affiliations
Orest J. Glembocki, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 1286:
Modulation Spectroscopy
Fred H. Pollak; Manuel Cardona; David E. Aspnes, Editor(s)

© SPIE. Terms of Use
Back to Top