Share Email Print
cover

Proceedings Paper

The effect of photodiode shape on dark current for MOS imagers
Author(s): Steven Taylor; Bruce E. Dunne; Lihong Jiao
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The effect of photodiode (PD) shape was studied in the attempt to reduce the dark current in MOS imagers. In such imaging systems, each pixel ideally produces a voltage directly proportional to the intensity of light incident on the PD. Because of non-idealities, the PD performance is compromised by the presence of dark current, which becomes the most significant source of noise degrading overall image quality, particularly for low light environments. Unfortunately, due to the statistical variability of dark current, it is not possible to simply correct the readout voltage error via subtraction. To minimize the effect, recent research suggests that PD shape and features have an influence on dark current levels. We test that assertion by considering PDs with different corners while maintaining high fill-factor rates, along with rectangular and triangular shapes to exploit charge transfer characteristics. In all, five PD geometries were built to test the influence of PD shape on the dark current signal including a traditional square shape, two square shapes with increasingly rounded corners (135 and 150 degrees), a triangular design with sharp corners and finally, a triangular design with 120 degree corners. Results indicate the PDs with a square shape and 90 degree corners exhibit the lowest dark current and highest readout voltage. Furthermore, the triangular shape suggests improved charge transfer characteristics; however, this improvement appears to be negated by an increase in dark current response. Therefore, our findings indicate that the traditional PD square shape is the preferred design.

Paper Details

Date Published: 13 March 2015
PDF: 8 pages
Proc. SPIE 9403, Image Sensors and Imaging Systems 2015, 94030N (13 March 2015); doi: 10.1117/12.2083257
Show Author Affiliations
Steven Taylor, DTS, Inc. (United States)
Bruce E. Dunne, Grand Valley State Univ. (United States)
Lihong Jiao, Grand Valley State Univ. (United States)


Published in SPIE Proceedings Vol. 9403:
Image Sensors and Imaging Systems 2015
Ralf Widenhorn; Antoine Dupret, Editor(s)

© SPIE. Terms of Use
Back to Top