Share Email Print

Proceedings Paper

Force-deflection behavior for C-block piezoelectric actuator architectures
Author(s): Diann E. Brei
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Although piezoelectric actuators are widely used in smart structure applications, they frequently can not generate directly both the force and deflection required. A new class of piezoelectric actuators, called C-blocks, have been developed that provide greater force than traditional bimorphs and greater deflection than stacks. C-blocks are piezoelectric bimorphs configured into a half circle shape and are fabricated on the mesoscale (10 - 10-3) mm). This paper describes how C-blocks can be used alone or combined in parallel and/or series, like building blocks, to form C-block actuator architectures to further improve force and/or deflection capabilities. This paper presents the derivation and experimental testing of force-deflection models for four common C-block architectures. These models predict the full static performance of C-blocks including the maximum performance characteristics. To test the models, force-deflection experiments were performed with a polymeric piezoelectric C- block. The experimental results are in close agreement with the behavior predicted by the model and demonstrate that a C-block has potential to generate approximately five times more force than an equivalent traditional straight bimorph and orders of magnitude greater deflection than an equivalent stack.

Paper Details

Date Published: 8 May 1995
PDF: 12 pages
Proc. SPIE 2443, Smart Structures and Materials 1995: Smart Structures and Integrated Systems, (8 May 1995); doi: 10.1117/12.208274
Show Author Affiliations
Diann E. Brei, Univ. of Michigan (United States)

Published in SPIE Proceedings Vol. 2443:
Smart Structures and Materials 1995: Smart Structures and Integrated Systems
Inderjit Chopra, Editor(s)

© SPIE. Terms of Use
Back to Top