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Proceedings Paper

Extended visual appearance texture features
Author(s): Simon-Frédéric Désage; Gilles Pitard; Maurice Pillet; Hugues Favrelière; Jean-Luc Maire; Fabrice Frelin; Serge Samper; Gaëtan Le Goïc
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Paper Abstract

The research purpose is to improve surface characterization based on what is perceived by human eye and on the 2006 CIE report. This report defines four headings under which possible measures might be made: color, gloss, translucency and texture. It is therefore important to define parameters able to discriminate surfaces, in accordance with the perception of human eye. Our starting point in assessing a surface is the measurement of its reflectance (acquisition of ABRDF for visual rendering), i.e. evaluate a set of images from different angles of lighting rather than a single image. The research question is how calculate, from this enhanced information, some discriminating parameters. We propose to use an image processing approach of texture that reflects spatial variations of pixel for translating changes in color, material and relief. From a set of images from different angles of light, we compute associated Haralick features for constructing new (extended) features, called Bidimensional Haralick Functions (BHF), and exploit them for discriminating surfaces. We propose another framework in three parts such as color, material and relief.

Paper Details

Date Published: 13 March 2015
PDF: 14 pages
Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980K (13 March 2015); doi: 10.1117/12.2081622
Show Author Affiliations
Simon-Frédéric Désage, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
Gilles Pitard, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
Maurice Pillet, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
Hugues Favrelière, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
Jean-Luc Maire, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
Fabrice Frelin, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
Serge Samper, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
LARMAUR, CNRS, Lab. de Recherche en Mécanique Appliquée de l'Univ. de Rennes 1 (France)
Gaëtan Le Goïc, SYMME, Lab. des Systèmes et Materiaux pour la Mécatronique, Univ. de Savoie (France)
LE21, Lab. d'Electronique, Informatique et Image, CNRS, Univ. de Bourgogne (France)


Published in SPIE Proceedings Vol. 9398:
Measuring, Modeling, and Reproducing Material Appearance 2015
Maria V. Ortiz Segovia; Philipp Urban; Francisco H. Imai, Editor(s)

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