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Proceedings Paper

The area of applicability of apparatus for analyzing the spectral characteristics of reflection, albedo and color parameters of flat objects
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Paper Abstract

Quality control of different coatings (colorful, paint, marker, safety, etc.) that are applied to the surface of various objects (both metallic and non-metallic) is an important problem. Also, there is a problem of dealing with counterfeit products. So it’s necessary to distinguish the fake replicas of marking from the authentic marking of producer. To solve these problems, we propose an automated apparatus for analysis and control of spectral reflection characteristics, albedo and color parameters of extended (up to 150 mm × 150 mm) flat objects. It allows constructing the color image of the object surface as well as its multispectral images in different regions of the spectrum. Herewith the color of the object surface can be calculated for various standard light sources (A, B, C, D65, E, F2, F7, F11, GE), or to any light source with a predetermined emission spectrum. The paper presents the description of working principles of the proposed apparatus as well as the results of reflection and multispectral analysis of different flat objects.

Paper Details

Date Published: 6 April 2015
PDF: 9 pages
Proc. SPIE 9369, Photonic Instrumentation Engineering II, 93690X (6 April 2015); doi: 10.1117/12.2081568
Show Author Affiliations
Elena V. Gorbunova, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Aleksandr N. Chertov, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Vladimir S. Peretyagin, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Elena A. Lastovskaia, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Valery V. Korotaev, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)


Published in SPIE Proceedings Vol. 9369:
Photonic Instrumentation Engineering II
Yakov G. Soskind; Craig Olson, Editor(s)

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