Share Email Print
cover

Proceedings Paper

Laser scanning microscope secondary moiré method for eliminating the effect of scanning distortion on deformation measurement
Author(s): Qinghua Wang; Hiroshi Tsuda; Satoshi Kishimoto; Yoshihisa Tanaka; Yutaka Kagawa
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, ; doi: 10.1117/12.2081183
Show Author Affiliations
Qinghua Wang, National Institute of Advanced Industrial Science and Technology (Japan)
Hiroshi Tsuda, AIST (Japan)
National Institute of Advanced Industrial Science and Technology (Japan)
Satoshi Kishimoto, National Institute for Materials Science (Japan)
Yoshihisa Tanaka, National Institute for Materials Science (Japan)
Yutaka Kagawa, National Institute for Materials Science (Japan)


Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)

© SPIE. Terms of Use
Back to Top