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Proceedings Paper

Two-wavelength microscopic speckle interferometry using colour CCD camera
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Paper Abstract

Single wavelength microscopic speckle interferometry is widely used for deformation, shape and non-destructive testing (NDT) of engineering structures. However the single wavelength configuration fails to quantify the large deformation due to the overcrowding of fringes and it cannot provide shape of a specimen under test. In this paper, we discuss a two wavelength microscopic speckle interferometry using single-chip colour CCD camera for characterization of microsamples. The use of colour CCD allows simultaneous acquisition of speckle patterns at two different wavelengths and thus it makes the data acquisition as simple as single wavelength case. For the quantitative measurement, an error compensating 8-step phase shifted algorithm is used. The system allows quantification of large deformation and shape of a specimen with rough surface. The design of the system along with few experimental results on small scale rough specimens is presented.

Paper Details

Date Published: 4 March 2015
PDF: 6 pages
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93023K (4 March 2015); doi: 10.1117/12.2081122
Show Author Affiliations
Paul Kumar Upputuri, Nanyang Technological Univ. (Singapore)
Manojit Pramanik, Nanyang Technological Univ. (Singapore)
Mahendra Prasad Kothiyal, Indian Institute of Technology Madras (India)
Krishna Mohan Nandigana, Indian Institute of Technology Madras (India)

Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)

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