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Proceedings Paper

Temperature aspect of degradation of electrochemical double-layer capacitors (EDLC)
Author(s): Dong-Cheon Baek; Hyun-Ho Kim; Soon-Bok Lee
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Paper Abstract

Electric double layer capacitors (EDLC) cells have a process variation and temperature dependency in capacitance so that balancing is required when they are connected in series, which includes electronic voltage management based on capacitance monitoring. This paper measured temperature aspect of capacitance periodically to monitor health and degradation behavior of EDLC stressed under high temperatures and zero below temperatures respectively, which enables estimation of the state of health (SOH) regardless of temperature. At high temperature, capacitance saturation and delayed expression of degradation was observed. After cyclic stress at zero below temperature, less effective degradation and time recovery phenomenon were occurred.

Paper Details

Date Published: 4 March 2015
PDF: 6 pages
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 930217 (4 March 2015); doi: 10.1117/12.2080945
Show Author Affiliations
Dong-Cheon Baek, Korea Institute of Machinery and Materials (Korea, Republic of)
Hyun-Ho Kim, Korea Advanced Institute of Science and Technology (Korea, Republic of)
Soon-Bok Lee, Korea Advanced Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)

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