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Proceedings Paper

In-situ measurements of nanoscale phenomena using diffraction phase microscopy
Author(s): Chris Edwards; Steven J. McKeown; Suk-Won Hwang; Paul J. Froeter; Xiuling Li; John A. Rogers; Gabriel Popescu; Lynford L. Goddard
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Paper Abstract

In this work, we present recent results on several novel applications including optically monitoring the dissolution of biodegradable materials proposed for use in biological electronic implants, the self-assembly of microtubes during semiconductor etching, and the expansion and deformation of palladium structures for use in hydrogen sensing applications. The measurements are done using diffraction phase microscopy (DPM), a quantitative phase imaging (QPI) technique, which uses the phase of the imaging field to reconstruct a map of the sample’s surface. It combines off-axis and common-path geometries allowing for single-shot, high-speed dynamics with sub-nanometer noise levels.

Paper Details

Date Published: 11 March 2015
PDF: 8 pages
Proc. SPIE 9336, Quantitative Phase Imaging, 93361K (11 March 2015); doi: 10.1117/12.2080253
Show Author Affiliations
Chris Edwards, Univ. of Illinois at Urbana-Champaign (United States)
Steven J. McKeown, Univ. of Illinois at Urbana-Champaign (United States)
Suk-Won Hwang, Korea Univ. (Korea, Republic of)
Paul J. Froeter, Univ. of Illinois at Urbana-Champaign (United States)
Xiuling Li, Univ. of Illinois at Urbana-Champaign (United States)
John A. Rogers, Univ. of Illinois at Urbana-Champaign (United States)
Gabriel Popescu, Univ. of Illinois at Urbana-Champaign (United States)
Lynford L. Goddard, Univ. of Illinois at Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 9336:
Quantitative Phase Imaging
Gabriel Popescu; YongKeun Park, Editor(s)

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