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Proceedings Paper

Speckle correlation reflection phase microscopy
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Proc. SPIE 9336, Quantitative Phase Imaging, 93360M; doi: 10.1117/12.2080166
Show Author Affiliations
Youngwoon Choi, Massachusetts Institute of Technology (United States)
Poorya Hosseini, Massachusetts Institute of Technology (United States)
Wonshik Choi, Korea Univ. (Korea, Republic of)
Ramachandra R. Dasari, Massachusetts Institute of Technology (United States)
Peter T. C. So, Massachusetts Institute of Technology (United States)
Zahid Yaqoob, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 9336:
Quantitative Phase Imaging
Gabriel Popescu; YongKeun Park, Editor(s)

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