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Proceedings Paper

Characterization of sidewall Bragg gratings using optical low-coherence interferometry with a broadband source
Author(s): Chen Zhang; Xin Wang; Christi K. Madsen
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Paper Abstract

In this work, we present fabrication and measurement of sidewall Bragg gratings in chalcogenide arsenic tri-sulfide (As2S3) on titanium-diffused lithium niobate (Ti:LiNbO3) channel waveguides. The transfer matrix method was used to analyze the temporal and spectral response of the sidewall gratings in the mid-infrared. The waveguide sidewall Bragg gratings were fabricated by electron-beam lithography (EBL), metal liftoff and subsequent reactive-ion etching (RIE). Insertion loss of the mid-infrared Ti:LiNbO3 optical waveguides were measured at ~2 dB and the propagation loss was estimated to be 0.45 dB/cm. Configuration of an optical low-coherence interferometer that is capable of characterizing the mid-infrared sidewall grating-based devices was experimentally implemented and preliminary results from fiber Bragg gratings are presented.

Paper Details

Date Published: 2 April 2015
PDF: 9 pages
Proc. SPIE 9365, Integrated Optics: Devices, Materials, and Technologies XIX, 93651G (2 April 2015); doi: 10.1117/12.2080104
Show Author Affiliations
Chen Zhang, Texas A&M Univ. (United States)
Xin Wang, Texas A&M Univ. (United States)
Christi K. Madsen, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 9365:
Integrated Optics: Devices, Materials, and Technologies XIX
Jean-Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)

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