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Proceedings Paper

Synchronous-digitization for video rate polarization modulated beam scanning second harmonic generation microscopy
Author(s): Shane Z. Sullivan; Emma L. DeWalt; Paul D. Schmitt; Ryan D. Muir; Garth J. Simpson
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Paper Abstract

Fast beam-scanning non-linear optical microscopy, coupled with fast (8 MHz) polarization modulation and analytical modeling have enabled simultaneous nonlinear optical Stokes ellipsometry (NOSE) and linear Stokes ellipsometry imaging at video rate (15 Hz). NOSE enables recovery of the complex-valued Jones tensor that describes the polarization-dependent observables, in contrast to polarimetry, in which the polarization stated of the exciting beam is recorded. Each data acquisition consists of 30 images (10 for each detector, with three detectors operating in parallel), each of which corresponds to polarization-dependent results. Processing of this image set by linear fitting contracts down each set of 10 images to a set of 5 parameters for each detector in second harmonic generation (SHG) and three parameters for the transmittance of the fundamental laser beam. Using these parameters, it is possible to recover the Jones tensor elements of the sample at video rate. Video rate imaging is enabled by performing synchronous digitization (SD), in which a PCIe digital oscilloscope card is synchronized to the laser (the laser is the master clock.) Fast polarization modulation was achieved by modulating an electro-optic modulator synchronously with the laser and digitizer, with a simple sine-wave at 1/10th the period of the laser, producing a repeating pattern of 10 polarization states. This approach was validated using Z-cut quartz, and NOSE microscopy was performed for micro-crystals of naproxen.

Paper Details

Date Published: 9 March 2015
PDF: 5 pages
Proc. SPIE 9330, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXII, 93300A (9 March 2015); doi: 10.1117/12.2079623
Show Author Affiliations
Shane Z. Sullivan, Purdue Univ. (United States)
Emma L. DeWalt, Purdue Univ. (United States)
Paul D. Schmitt, Purdue Univ. (United States)
Ryan D. Muir, Purdue Univ. (United States)
Garth J. Simpson, Purdue Univ. (United States)


Published in SPIE Proceedings Vol. 9330:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXII
Thomas G. Brown; Carol J. Cogswell; Tony Wilson, Editor(s)

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