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Proceedings Paper

Spectral x-ray diffraction using a 6 megapixel photon counting array detector
Author(s): Ryan D. Muir; Nicholas R. Pogranichniy; J. Lewis Muir; Shane Z. Sullivan; Kevin Battaile; Anne M. Mulichak; Scott J. Toth; Lisa J. Keefe; Garth J. Simpson
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Paper Abstract

Pixel-array array detectors allow single-photon counting to be performed on a massively parallel scale, with several million counting circuits and detectors in the array. Because the number of photoelectrons produced at the detector surface depends on the photon energy, these detectors offer the possibility of spectral imaging. In this work, a statistical model of the instrument response is used to calibrate the detector on a per-pixel basis. In turn, the calibrated sensor was used to perform separation of dual-energy diffraction measurements into two monochromatic images. Targeting applications include multi-wavelength diffraction to aid in protein structure determination and X-ray diffraction imaging.

Paper Details

Date Published: 12 March 2015
PDF: 5 pages
Proc. SPIE 9401, Computational Imaging XIII, 940109 (12 March 2015); doi: 10.1117/12.2079548
Show Author Affiliations
Ryan D. Muir, Purdue Univ. (United States)
Nicholas R. Pogranichniy, Purdue Univ. (United States)
J. Lewis Muir, Argonne National Lab. (United States)
Shane Z. Sullivan, Purdue Univ. (United States)
Kevin Battaile, Argonne National Lab. (United States)
Anne M. Mulichak, Argonne National Lab. (United States)
Scott J. Toth, Purdue Univ. (United States)
Lisa J. Keefe, Purdue Univ. (United States)
Garth J. Simpson, Purdue Univ. (United States)


Published in SPIE Proceedings Vol. 9401:
Computational Imaging XIII
Charles A. Bouman; Ken D. Sauer, Editor(s)

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