Share Email Print
cover

Proceedings Paper

Mechanisms driving the catastrophic optical damage in high-power laser diodes
Author(s): J. Souto; J. L. Pura; M. Rodríguez; J. Anaya; Alfredo Torres; J. Jimenéz
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The catastrophic optical damage (COD) of laser diodes consists of the sudden drop off of the optical power. COD is generally associated with a thermal runaway mechanism in which the active zone of the laser is molten in a positive feedback process. The full sequence of the degradation follows different phases: in the first phase, a weak zone of the laser is incubated and the temperature is locally increased there; when a critical temperature is reached the thermal runaway process takes place. Usually, the positive feedback leading to COD is circumscribed to the sequential enhancement of the optical absorption in a process driven by the increase of the temperature. However, the meaning of the critical temperature has not been unambiguously established. Herein, we will discuss about the critical temperature, and the physical mechanisms involved in this process. The influence of the progressive deterioration of the thermal conductivity of the laser structure as a result of the degradation during the laser operation will be addressed.

Paper Details

Date Published: 13 March 2015
PDF: 7 pages
Proc. SPIE 9348, High-Power Diode Laser Technology and Applications XIII, 93480O (13 March 2015); doi: 10.1117/12.2079464
Show Author Affiliations
J. Souto, Univ. de Valladolid (Spain)
J. L. Pura, Univ. de Valladolid (Spain)
M. Rodríguez, Univ. de Valladolid (Spain)
J. Anaya, Univ. of Bristol (United Kingdom)
Alfredo Torres, Univ. de Valladolid (Spain)
J. Jimenéz, Univ. de Valladolid (Spain)


Published in SPIE Proceedings Vol. 9348:
High-Power Diode Laser Technology and Applications XIII
Mark S. Zediker, Editor(s)

© SPIE. Terms of Use
Back to Top