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Proceedings Paper

Erbium nanoparticle doped fibers for efficient, resonantly-pumped Er-doped fiber lasers
Author(s): E. Joseph Friebele; Colin Baker; Charles G. Askins; Jake P. Fontana; Michael P. Hunt; John R. Peele; Barbara A. Marcheschi; Euneku Oh; Woohong Kim; Jasbinder Sanghera; Jun Zhang; Radha K. Pattnaik; Larry D. Merkle; Mark Dubinskii
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Paper Abstract

Nanoparticle (NP) doping is a new technique for making erbium-doped fibers (EDFs); the Er ions are surrounded by a cage of aluminum and oxygen ions, substantially reducing Er3+ ion-ion energy exchange and its deleterious effects on laser performance. Er-Al-doped NPs have been synthesized and doped in-situ into the silica soot of the preform core. We report the first known measurements of NP-doped EDFs in a resonantly-core pumped master oscillator-power amplifier (MOPA) configuration; the optical-to-optical slope efficiency was 80.4%, which we believe is a record for this type of fiber.

Paper Details

Date Published: 4 March 2015
PDF: 8 pages
Proc. SPIE 9344, Fiber Lasers XII: Technology, Systems, and Applications, 934412 (4 March 2015); doi: 10.1117/12.2079443
Show Author Affiliations
E. Joseph Friebele, U.S. Naval Research Lab. (United States)
Colin Baker, U.S. Naval Research Lab. (United States)
Charles G. Askins, U.S. Naval Research Lab. (United States)
Jake P. Fontana, U.S. Naval Research Lab. (United States)
Michael P. Hunt, Univ. Research Foundation (United States)
John R. Peele, Sotera Defense Solutions, Inc. (United States)
Barbara A. Marcheschi, U.S. Naval Research Lab. (United States)
Euneku Oh, Sotera Defense Systems (United States)
Woohong Kim, U.S. Naval Research Lab. (United States)
Jasbinder Sanghera, U.S. Naval Research Lab. (United States)
Jun Zhang, U.S. Army Research Lab. (United States)
Radha K. Pattnaik, U.S. Army Research Lab. (United States)
Larry D. Merkle, U.S. Army Research Lab. (United States)
Mark Dubinskii, U.S. Army Research Lab. (United States)


Published in SPIE Proceedings Vol. 9344:
Fiber Lasers XII: Technology, Systems, and Applications
L. Brandon Shaw, Editor(s)

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