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Proceedings Paper

Equilibrium modal power distribution measurement of step-index hard plastic cladding and graded-index silica multimode fibers
Author(s): Ruichen Tao; Takehiro Hayashi; Manabu Kagami; Shigeru Kobayashi; Manabu Yasukawa; Hui Yang; David Robinson; Hadi Baghsiahi; F. Aníbal Fernández; David R. Selviah
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Paper Abstract

A stable reproducible optical standard source for measuring multimode optical fiber attenuation is required as recent round robin measurements of such fibers at several international companies and national standards organizations showed significant variation when using a source having only the encircled flux in the near field emerging from it defined. The paper presents and compares the far field modal power distributions for (i) 2 km and 3 km step-index multimode Hard Plastic Cladding Fibers, HPCF, (SI-MMF) with 200 μm silica core diameter, 0.37 numerical aperture (NA) and polymer cladding, (ii) a 10 m silica graded-index multimode fiber (GI-MMF) with 50 μm core diameter and 0.2 NA, and (ii) a near field Encircled Flux Mode Convertor or “modcon”. A free space method for measuring the far field using a Lightemitting diode (LED) centered at 850 nm wavelength with 40 nm 10 dB-bandwidth and a charge-coupled device (CCD) camera is compared with a f-theta multi-element lens based far field pattern (FFP) system. Mandrels of different diameter and different numbers of turns of the fiber around them were used to achieve an equilibrium mode distribution (EMD) for the GI-MMF. The paper defines encircled angular flux (EAF) as the fraction of the total optical power radiating from a multimode optical fiber core within a certain solid angle in the far field. The paper calculates the EAF when the solid angle increases from the far field centroid.

Paper Details

Date Published: 3 April 2015
PDF: 9 pages
Proc. SPIE 9368, Optical Interconnects XV, 93680N (3 April 2015); doi: 10.1117/12.2079355
Show Author Affiliations
Ruichen Tao, Univ. College London (United Kingdom)
Takehiro Hayashi, HAT Lab Inc. (Japan)
Manabu Kagami, Toyota Central R&D Labs., Inc. (Japan)
Shigeru Kobayashi, Tyco Electronics Japan G.K. (Japan)
Manabu Yasukawa, HAT Lab. Inc. (Japan)
Hui Yang, Arden Photonics Ltd. (United Kingdom)
David Robinson, Arden Photonics Ltd. (United Kingdom)
Hadi Baghsiahi, Univ. College London (United Kingdom)
F. Aníbal Fernández, Univ. College London (United Kingdom)
David R. Selviah, Univ. College London (United Kingdom)


Published in SPIE Proceedings Vol. 9368:
Optical Interconnects XV
Henning Schröder; Ray T. Chen, Editor(s)

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