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Proceedings Paper

Investigations on the potential of a low power diode pumped Er:YAG laser system for oral surgery
Author(s): Karl Stock; Holger Wurm; Florian Hausladen; Sophia Wagner; Raimund Hibst
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Paper Abstract

Flash lamp pumped Er:YAG-lasers are used in clinical practice for dental applications successfully. As an alternative, several diode pumped Er:YAG laser systems (Pantec Engineering AG) become available, with mean laser power of 2W, 15W, and 30W. The aim of the presented study is to investigate the potential of the 2W Er:YAG laser system for oral surgery. At first an appropriate experimental set-up was realized with a beam delivery and both, a focusing unit for non-contact tissue cutting and a fiber tip for tissue cutting in contact mode. In order to produce reproducible cuts, the samples (porcine gingiva) were moved by a computer controlled translation stage. On the fresh samples cutting depth and quality were determined by light microscopy. Afterwards histological sections were prepared and microscopically analyzed regarding cutting depth and thermal damage zone. The experiments show that low laser power ≤ 2W is sufficient to perform efficient oral soft tissue cutting with cut depth up to 2mm (sample movement 2mm/s). The width of the thermal damage zone can be controlled by the irradiation parameters within a range of about 50μm to 110μm. In general, thermal injury is more pronounced using fiber tips in contact mode compared to the focused laser beam. In conclusion the results reveal that even the low power diode pumped Er:YAG laser is an appropriate tool for oral surgery.

Paper Details

Date Published: 24 February 2015
PDF: 6 pages
Proc. SPIE 9306, Lasers in Dentistry XXI, 930605 (24 February 2015); doi: 10.1117/12.2078723
Show Author Affiliations
Karl Stock, Univ. Ulm (Germany)
Holger Wurm, Univ. Ulm (Germany)
Florian Hausladen, Univ. Ulm (Germany)
Sophia Wagner, Univ. Ulm (Germany)
Raimund Hibst, Univ. Ulm (Germany)


Published in SPIE Proceedings Vol. 9306:
Lasers in Dentistry XXI
Peter Rechmann; Daniel Fried, Editor(s)

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