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Proceedings Paper

Analysis of thermal depolarization compensation using full vectorial beam propagation method in laser amplifiers
Author(s): Rainer Hartmann; Christoph Pflaum; Thomas Graupeter
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Paper Abstract

We developed a complex physical model for simulating laser amplifiers to numerically analyze birefringence effects. This model includes pump configuration, thermal lensing effects, birefringence, and beam propagation in the laser amplifier. Temperature, deformation, and stress inside the laser crystal were calculated using a three-dimensional finite element analysis (FEA). The pump configuration is simulated using a three-dimensional ray tracing or an approximation based on super-Gaussian functions.

Our simulations show the depolarization of a linearly polarized electromagnetic wave in a cylindrical laser crystal. These simulations were performed using a three-dimensional full vectorial beam propagation method (VBPM). Stress induced birefringence can be compensated well for moderate pumping powers. High power amplification requires sensitive alignment. Our simulation technique calculates the influence of the photo-elastic effect inside the laser crystal accurately. Detailed knowledge about beam waist and depolarization is needed to develop compensation techniques for high power output beams with low depolarization losses.

Paper Details

Date Published: 3 March 2015
PDF: 9 pages
Proc. SPIE 9343, Laser Resonators, Microresonators, and Beam Control XVII, 93431I (3 March 2015); doi: 10.1117/12.2077990
Show Author Affiliations
Rainer Hartmann, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
Erlangen Graduate School in Advanced Optical Technologies (Germany)
Christoph Pflaum, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)
Erlangen Graduate School in Advanced Optical Technologies (Germany)
Thomas Graupeter, Friedrich-Alexander-Univ. Erlangen-Nürnberg (Germany)


Published in SPIE Proceedings Vol. 9343:
Laser Resonators, Microresonators, and Beam Control XVII
Alexis V. Kudryashov; Alan H. Paxton; Vladimir S. Ilchenko; Lutz Aschke; Kunihiko Washio, Editor(s)

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