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Proceedings Paper

Transmission loss in x-ray framing cameras
Author(s): Xiaohong Bai; BingLi Zhu; Yonglin Bai; Yongsheng Gou; Peng Xu; Jing Jin; Bo Wang; Baiyu Liu; Junjun Qin
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Paper Abstract

We present evidence that transmission loss in gated x-ray framing cameras can affect relative gains. Transmission loss is caused by a variety of factors including: incident voltage waveform, matched load, width of Au electrode gap, and so on. The transition electrode in MCP (Micro-channel Plate) is continuous gradual change line, and it has good capability of compensation. When continuous gradual change micro-strip line is designed, dielectric loss tangent is one of transmission loss factors too. The model structure is designed based on the analysis of modeling and simulation techniques and experiment data as well as forecast target. The transmission loss is reduced from 50% to 25%, the transmission efficiency is greatly improved.

Paper Details

Date Published: 19 February 2015
PDF: 7 pages
Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94491K (19 February 2015); doi: 10.1117/12.2077374
Show Author Affiliations
Xiaohong Bai, Xi'an Institute of Optics and Precision Mechanics (China)
BingLi Zhu, Xi'an Institute of Optics and Precision Mechanics (China)
Yonglin Bai, Xi'an Institute of Optics and Precision Mechanics (China)
Yongsheng Gou, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Peng Xu, Xi’an Institute of Optics and Precision Mechanics (China)
Jing Jin, Univ. of Chinese Academy of Sciences (China)
Bo Wang, Xi'an Institute of Optics and Precision Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Baiyu Liu, Xi'an Institute of Optics and Precision Mechanics (China)
Junjun Qin, Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9449:
The International Conference on Photonics and Optical Engineering (icPOE 2014)
Ailing Tian; Anand Asundi; Weiguo Liu; Chunmin Zhang, Editor(s)

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