Share Email Print
cover

Proceedings Paper

Optical fiber sensors embedded in composite panels for impact detection
Author(s): Chia-Chen Chang; James S. Sirkis
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper mainly describes a methodology of finding appropriate optical fiber sensors and associated potential demodulation techniques that have the capability to measure impact induced high-strain rate events in graphite/epoxy panels. The capacity of the sensor's dynamic range has to accommodate the average failure strain of about 9,000 (mu) (epsilon) and center frequency of about 40 Hz for a typical low velocity impact event for [902/04/OF(0)/04/902] and [(45/-45)3/OF(0)/(-45/45)3] layups. Three potential demodulators are investigated. These include the synthetic heterodyne with differential-cross-multiplier, single channel phase tracker, and sin((phi) )/cos((phi) ) based analog phase tracker all using a 10 KHz sinusoidal modulation. The maximum sensor lengths for different sensor types have been calculated based on the Fourier spectrum of a typical impact event and maximum detectable phase vs. frequency of these demodulators. As a result, a localized and reflective version of a In-Line Fiber Etalon sensor with a maximum cavity length of 73 micrometers for 1.3 micrometers wave-length of a light source is selected for impact testing. The strain responses from three different demodulators are comparable to that of a surface mounted resistance strain gage.

Paper Details

Date Published: 20 April 1995
PDF: 12 pages
Proc. SPIE 2444, Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation, (20 April 1995); doi: 10.1117/12.207700
Show Author Affiliations
Chia-Chen Chang, Univ. of Maryland/College Park (United States)
James S. Sirkis, Univ. of Maryland/College Park (United States)


Published in SPIE Proceedings Vol. 2444:
Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation
William B. Spillman, Editor(s)

© SPIE. Terms of Use
Back to Top