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Proceedings Paper

Optical sensing as a means of monitoring health of multicomputer networks
Author(s): David L. Forbis; Kent A. Murphy; Richard O. Claus
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Paper Abstract

The goal of this work is to perform physical fault detection on a multicomputer by using interferometric optical sensors to measure applied strain on interconnection data links. The main interest in research of this sort is to provide reliable optical interconnections between computers that may operate in harsh environments. An example of such a system would be found on an aircraft or other military vehicle which, by nature of its function, is expected to undergo some form of structural trauma in its operating lifetime. This work will examine an application of the problem of dynamic fault tolerance, and provide an example of a practical solution. Damage will be inflicted upon a data link of an operational hybrid communication/sensing multicomputer and detected with the use of optical sensors. It will be shown that the multicomputer can reroute all communications functions and reallocate computational tasks around this faulty data link with no loss of information or functionality. It will also be shown that the multicomputer can accurately convert the output of an extrinsic Fabry-Perot interferometer into a strain value and compare this calculated value to a predetermined maximum strain value, by use of an algorithm that continuously calculates strain based on the sinusoidal output of the interferometric sensor

Paper Details

Date Published: 20 April 1995
PDF: 12 pages
Proc. SPIE 2444, Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation, (20 April 1995); doi: 10.1117/12.207689
Show Author Affiliations
David L. Forbis, Virginia Polytechnic Institute and State Univ. (United States)
Kent A. Murphy, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 2444:
Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation
William B. Spillman, Editor(s)

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