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Proceedings Paper

A new phase error compensation method in digital holographic microscopy
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Paper Abstract

In this paper we present a new method to compensate for phase aberrations and image distortion with recording single digital hologram in digital holographic microscopy. In our method, tilt is removed from the abberrated phase map first. Then an area of interest (AOI) is generated by flood filled algorithm. By fitting AOI with discrete orthogonal Zernike polynomials, error phase map in the form of a series of Zernike polynomials is obtained. Final result can be calculated by subtracting the error phase map from the abberrated phase map. Through applying our method in microlens testing, phase aberrations and image distortion introduced by microscope objective are well suppressed.

Paper Details

Date Published: 4 March 2015
PDF: 8 pages
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93023M (4 March 2015); doi: 10.1117/12.2076855
Show Author Affiliations
Zhaomin Wang, Nanyang Technological Univ. (Singapore)
Ngee Ann Polytechnic (Singapore)
Weijuan Qu, Ngee Ann Polytechnic (Singapore)
Yongfu Wen, Ngee Ann Polytechnic (Singapore)
Fang Yang, Ngee Ann Polytechnic (Singapore)
Anand Asundi, Nanyang Technological Univ. (Singapore)

Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)

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