Share Email Print
cover

Proceedings Paper

Fabrication error tolerant SOI WDM device using bidirectional angled multimode interferometers
Author(s): Graham T. Reed; Youfang Hu; David J. Thomson; Ali Z. Khokhar; Stevan Stanković; Colin J. Mitchell; Frederic Y. Gardes; Goran Z. Mashanovich
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We have demonstrated a bidirectional wavelength division (de)multiplexer (WDM) on the silicon-on-insulator platform. An excellent match of the peak transmission wavelength of each channel between the two AMMIs was achieved. This type of device is ideal for integrated optical transceivers where the transmission wavelengths are required to match with the receiving wavelengths. The device also benefits from simple fabrication (as only a single lithography and etching step is required), improved convenience for the transceiver layout design, a reduction in tuning power and circuitry, and efficient use of layout space.

Paper Details

Date Published: 27 February 2015
PDF: 7 pages
Proc. SPIE 9367, Silicon Photonics X, 936704 (27 February 2015); doi: 10.1117/12.2076824
Show Author Affiliations
Graham T. Reed, Univ. of Southampton (United Kingdom)
Youfang Hu, Univ. of Southampton (United Kingdom)
David J. Thomson, Univ. of Southampton (United Kingdom)
Ali Z. Khokhar, Univ. of Southampton (United Kingdom)
Stevan Stanković, Univ. of Southampton (United Kingdom)
Colin J. Mitchell, Univ. of Southampton (United Kingdom)
Frederic Y. Gardes, Univ. of Southampton (United Kingdom)
Goran Z. Mashanovich, Univ. of Southampton (United Kingdom)


Published in SPIE Proceedings Vol. 9367:
Silicon Photonics X
Graham T. Reed; Michael R. Watts, Editor(s)

© SPIE. Terms of Use
Back to Top