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Proceedings Paper

Multiplexed absolute strain measurements using extrinsic Fabry-Perot interferometers
Author(s): Mark E. Jones; Jennifer L. Grace; Jonathan A. Greene; Tuan A. Tran; Vikram Bhatia; Kent A. Murphy; Richard O. Claus
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Paper Abstract

Extrinsic Fabry-Perot interferometric (EFPI) sensors have previously been demonstrated for relative strain and temperature measurements for smart structure applications. Inherent difficulties in the signal processing of these devices has created the need for absolute measurement capabilities. In this paper, we present an absolute measurement technique based upon white-light interferometric path matching. The system matches a reference gap to the sensing gap of an EFPI. When the difference of these two lengths is within the coherence length of the source, an intensity envelope is created in the system output. Determination of the corresponding path mismatch indicates the size of the sensor gap and hence strain can be determined. This measurement technique is capable of multiplexing an array of EFPI sensors and data will be presented demonstrating four multiplexed devices. Theoretical considerations for system optimization are also presented.

Paper Details

Date Published: 20 April 1995
PDF: 9 pages
Proc. SPIE 2444, Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation, (20 April 1995); doi: 10.1117/12.207682
Show Author Affiliations
Mark E. Jones, Fiber and Sensor Technologies, Inc. (United States)
Jennifer L. Grace, Fiber and Sensor Technologies, Inc. (United States)
Jonathan A. Greene, Fiber and Sensor Technologies, Inc. (United States)
Tuan A. Tran, Fiber and Sensor Technologies, Inc. (United States)
Vikram Bhatia, Virginia Polytechnic Institute and State Univ. (United States)
Kent A. Murphy, Virginia Polytechnic Institute and State Univ. (United States)
Richard O. Claus, Virginia Polytechnic Institute and State Univ. (United States)


Published in SPIE Proceedings Vol. 2444:
Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation
William B. Spillman, Editor(s)

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