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Proceedings Paper

Wideband perfect coherent absorber based on white-light cavity
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Paper Abstract

Coherent Perfect Absorbers (CPAs) are optical cavities which can be described as time-reversed lasers where light waves that enter the cavity, coherently interfere and react with the intra-cavity losses to yield perfect absorption. In contrast to lasers, which benefit from high coherency and narrow spectral linewidths, for absorbers these properties are often undesirable as absorption at a single frequency is highly susceptible to spectral noise and inappropriate for most practical applications. Recently, a new class of cavities, characterized by a spectrally wide resonance has been proposed. Such resonators, often referred to as White Light Cavities (WLCs), include an intra-cavity superluminal phase element, designed to provide a phase response with a slope that is opposite in sign and equal in magnitude to that of light propagation through the empty cavity. Consequently, the resonance phase condition in WLCs is satisfied over a band of frequencies providing a spectrally wide resonance. WLCs have drawn much attention due to their attractiveness for various applications such as ultra-sensitive sensors and optical buffering components. Nevertheless, WLCs exhibit inherent losses that are often undesirable. Here we introduce a simple wideband CPA device that is based on the WLC concept along with a complete analytical analysis. We present analytical and FDTD simulations of a practical, highly compact (12µm), Silicon based WLC-CPA that exhibits a flat and wide absorption profile (40nm) and demonstrate its usefulness as an optical pulse terminator (>35db isolation) and an all optical modulator that span the entire C-Band and exhibit high immunity to spectral noise.

Paper Details

Date Published: 10 March 2015
PDF: 8 pages
Proc. SPIE 9378, Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII, 93780G (10 March 2015); doi: 10.1117/12.2076722
Show Author Affiliations
Omer Kotlicki, Tel Aviv Univ. (Israel)
Jacob Scheuer, Tel Aviv Univ. (Israel)

Published in SPIE Proceedings Vol. 9378:
Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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