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Proceedings Paper

Acoustic emission testing on an F/A-18 E/F titanium bulkhead
Author(s): Christopher A. Martin; Craig B. Van Way; Allen J. Lockyer; Jayanth N. Kudva; Steve M. Ziola
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Paper Abstract

An important opportunity recently transpired at Northrop Grumman Corporation to instrument an F/A - 18 E/F titanium bulkhead with broad band acoustic emission sensors during a scheduled structural fatigue test. The overall intention of this effort was to investigate the potential for detecting crack propagation using acoustic transmission signals for a large structural component. Key areas of experimentation and experience included (1) acoustic noise characterization, (2) separation of crack signals from extraneous noise, (3) source location accuracy, and (4) methods of acoustic transducer attachment. Fatigue cracking was observed and monitored by strategically placed acoustic emission sensors. The outcome of the testing indicated that accurate source location still remains enigmatic for non-specialist engineering personnel especially at this level of structural complexity. However, contrary to preconceived expectations, crack events could be readily separated from extraneous noise. A further dividend from the investigation materialized in the form of close correspondence between frequency domain waveforms of the bulkhead test specimen tested and earlier work with thick plates.

Paper Details

Date Published: 20 April 1995
PDF: 8 pages
Proc. SPIE 2444, Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation, (20 April 1995); doi: 10.1117/12.207672
Show Author Affiliations
Christopher A. Martin, Northrop Grumman Corp. (United States)
Craig B. Van Way, Northrop Grumman Corp. (United States)
Allen J. Lockyer, Northrop Grumman Corp. (United States)
Jayanth N. Kudva, Northrop Grumman Corp. (United States)
Steve M. Ziola, Digital Wave Corp. (United States)


Published in SPIE Proceedings Vol. 2444:
Smart Structures and Materials 1995: Smart Sensing, Processing, and Instrumentation
William B. Spillman, Editor(s)

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