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Proceedings Paper

Characterization of far field of diode laser by three dimensional measurement
Author(s): Hui Liu; Zhiyuan Yuan; Long Cui; Di Wu; Xingsheng Liu
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Paper Abstract

In this paper three dimensional characterization of the far field of diode laser beam is proposed. Both the divergence angle and intensity distribution can be extracted and analyzed from the measurement results with obliquity factor correction and power transmission correction. The instrument provides high resolution and fast measurement.

Paper Details

Date Published: 26 February 2015
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Proc. SPIE 9346, Components and Packaging for Laser Systems, 93461A (26 February 2015); doi: 10.1117/12.2076548
Show Author Affiliations
Hui Liu, Focuslight Technologies Co., Ltd. (China)
Xi'an Institute of Optics and Precision Mechanics (China)
Zhiyuan Yuan, Focuslight Technologies Co., Ltd. (China)
Long Cui, Focuslight Technologies Co., Ltd. (China)
Di Wu, Focuslight Technologies Co., Ltd. (China)
Xingsheng Liu, Focuslight Technologies Co., Ltd. (China)
Xi'an Institute of Optics and Precision Mechanics (China)


Published in SPIE Proceedings Vol. 9346:
Components and Packaging for Laser Systems
Alexei L. Glebov; Paul O. Leisher, Editor(s)

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