Share Email Print
cover

Proceedings Paper

The influence of the tip shape on the STM scans
Author(s): Guangxi Zhou; Mengqi Tian; Miao Song
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Four different shapes of probe tips are employed to perform scanning experiments on highly ordered pyrolytic graphite samples. I-Z curves and I-V curves for the tunnel current on the surface are obtained and, in the meantime, the influences of tip shape on the height scanning image are analyzed. The results show that tip shape differences have remarkable influences on the sharpness of probe tip, the resolution of the height scanning images increases with the sharpness of probe tip. The requirement for ladder scan level is much lower than that for the atom scan level. Different shapes of probe tips have little effects on the I-V curves for ladder scan. Accordingly, probe tips with only two cuts, which are suitable for ladder scan, can be obtained easily and accurately

Paper Details

Date Published: 19 February 2015
PDF: 9 pages
Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), 94492X (19 February 2015); doi: 10.1117/12.2075995
Show Author Affiliations
Guangxi Zhou, Xi'an Polytechnic Univ. (China)
Mengqi Tian, Xi'an Polytechnic Univ. (China)
Miao Song, Xi'an Polytechnic Univ. (China)


Published in SPIE Proceedings Vol. 9449:
The International Conference on Photonics and Optical Engineering (icPOE 2014)
Ailing Tian; Anand Asundi; Weiguo Liu; Chunmin Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top