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Proceedings Paper

Study of femtosecond laser spectrally resolved interferometry distance measurement based on excess fraction method
Author(s): Rongyi Ji; Kun Hu; Yao Li; Weihu Zhou; Demin Liu
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Paper Abstract

Spectrally resolved interferometry (SRI) technology is a high precision laser interferometry technology, whose short non-ambiguity range (NAR) increases the precision requirement of pre-measurement in absolute distance measurement. In order to improve NAR of femtosecond laser SRI, the factors affecting NAR are studied in measurement system, and synthetic NAR method is presented based on excess fraction method to solve this question. A theoretical analysis is implemented and two Fabry-Perot Etalons with different free spectral range are selected to carry out digital simulation experiment. The experiment shows that NAR can be improved using synthetic NAR method and the precision is the same with that of fundamental femtosecond laser SRI.

Paper Details

Date Published:
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Proc. SPIE 9449, The International Conference on Photonics and Optical Engineering (icPOE 2014), ; doi: 10.1117/12.2075799
Show Author Affiliations
Rongyi Ji, Academy of Opto-Electronics (China)
Kun Hu, Academy of Opto-Electronics (China)
Yao Li, Academy of Opto-Electronics (China)
Weihu Zhou, Academy of Opto-Electronics (China)
Demin Liu, Huazhong University of Science and Technology (China)


Published in SPIE Proceedings Vol. 9449:
The International Conference on Photonics and Optical Engineering (icPOE 2014)
Ailing Tian; Anand Asundi; Weiguo Liu; Chunmin Zhang, Editor(s)

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