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Proceedings Paper

Review of recent developments of spatial phase-shift digital shearography
Author(s): Xin Xie; Xiaona Li; Xu Chen; Lianxiang Yang
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Paper Abstract

In the last decade, due to the fast development of phase-shift technique, the measurement sensitivity of digital shearography (DS) technology has been increased tens of times which brings the technology itself a wide acceptance by the industry as a practical measurement tool for quality inspection and non-destructive testing. In common sense, compare to Temporal Phase-Shift Digital Shearography (TPS-DS), Spatial Phase-Shift Digital Shearograhy (SPS-DS) has the advantage of a broader capability for both static and dynamic measurement applications while keeps the disadvantage of lower phase-map quality. Recently, with new developments, the phase map quality of spatial phase-shift digital shearography has been greatly improved which is now comparable to the temporal phase-shift technique. This article gives a review of recent developments of spatial phase-shift digital shearography. Theory, experimental setup, phase-map results and applications are shown in detail.

Paper Details

Date Published: 4 March 2015
PDF: 12 pages
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93020E (4 March 2015); doi: 10.1117/12.2075536
Show Author Affiliations
Xin Xie, Oakland Univ. (United States)
Xiaona Li, Oakland Univ. (United States)
Xu Chen, Oakland Univ. (United States)
Lianxiang Yang, Oakland Univ. (United States)


Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)

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