In the last decade, due to the fast development of phase-shift technique, the measurement sensitivity of digital shearography (DS) technology has been increased tens of times which brings the technology itself a wide acceptance by the industry as a practical measurement tool for quality inspection and non-destructive testing. In common sense, compare to Temporal Phase-Shift Digital Shearography (TPS-DS), Spatial Phase-Shift Digital Shearograhy (SPS-DS) has the advantage of a broader capability for both static and dynamic measurement applications while keeps the disadvantage of lower phase-map quality. Recently, with new developments, the phase map quality of spatial phase-shift digital shearography has been greatly improved which is now comparable to the temporal phase-shift technique. This article gives a review of recent developments of spatial phase-shift digital shearography. Theory, experimental setup, phase-map results and applications are shown in detail.

Date Published: 4 March 2015
PDF: 12 pages
Proc. SPIE 9302, International Conference on Experimental Mechanics 2014, 93020E (4 March 2015); doi: 10.1117/12.2075536

Published in SPIE Proceedings Vol. 9302:
International Conference on Experimental Mechanics 2014
Chenggen Quan; Kemao Qian; Anand Asundi; Fook Siong Chau, Editor(s)