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Proceedings Paper

Electron microscopy studies of CNT layers
Author(s): Mirosław Kozłowski; Joanna Radomska; Halina Wronka; Elżbieta Czerwosz; Kamil Sobczak
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Paper Abstract

SEM and TEM use in an investigation of CNT-Ni layers different properties is shown. We present the possibilities of using different SEM modes (SE - secondary electrons, LABE - low angle backscattered electrons) for studies of C-Ni and CNT-Ni layers topography, morphology and cross-sectional investigations (adhesion, pores size and shape, uniformity). Correlation between concentration of Ni in studied layers and technological parameters as well as in a case of CNT-Ni films correlations of Ni concentration and a diameter of carbon nanotubes are discussed. TEM studies concentrate on structure of Ni nanograins in C-Ni layers and CNT-Ni layers, CNT structure and defects, nanoonion structure. We present methods of determination of graphite plane number in MWCNTs, distance between these planes, role of catalyst position in CNT growth and interaction between catalyst and substrate. EDS method for qualitative analysis of Ni catalyst in these layers was also presented.

Paper Details

Date Published: 25 November 2014
PDF: 8 pages
Proc. SPIE 9290, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014, 92901C (25 November 2014); doi: 10.1117/12.2075180
Show Author Affiliations
Mirosław Kozłowski, Tele & Radio Research Institute (Poland)
Joanna Radomska, Tele & Radio Research Institute (Poland)
Halina Wronka, Tele & Radio Research Institute (Poland)
Elżbieta Czerwosz, Tele & Radio Research Institute (Poland)
Kamil Sobczak, Institute of Physics (Poland)


Published in SPIE Proceedings Vol. 9290:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2014
Ryszard S. Romaniuk, Editor(s)

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